A trial for in situ quantitative TEM-EELS measurement related to the photoreaction process of TiO2 films

Nanotechnology

Volumn 15, Issue 6, 2004, Pages

  Yoshida, Kenta ^a   Yamasaki, Jun ^a   Tanaka, Nobuo ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CHEMICAL VAPOR DEPOSITION; DECOMPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; GAS CHROMATOGRAPHY; HYDROCARBONS; IN SITU PROCESSING; IRRADIATION; PARAMAGNETIC RESONANCE; PHOTOCATALYSIS; PHOTOREACTIVITY; SEMICONDUCTOR MATERIALS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION;

HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); HONDA-FUJISHIMA EFFECTS; PHOTODECOMPOSITION; SPATIAL RESOLUTION;

TITANIUM DIOXIDE;

EID: 3042548994     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/6/006     Document Type: Conference Paper

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