Stress profile and thermal expansion of layered materials determined from surface stresses

Applied Physics Letters

Volumn 84, Issue 23, 2004, Pages 4661-4662

  Malzbender, Jürgen ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLENESS; MICROELECTROMECHANICAL DEVICES; PROFILOMETRY; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; SINTERING; STRAIN; SURFACE PROPERTIES; TENSILE STRESS; THERMAL EFFECTS; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

BILAYERED SYSTEMS; STRESS PROFILES; SURFACE STRESSES; THERMAL BARRIER SYSTEMS;

MULTILAYERS;

EID: 3042547510     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1759773     Document Type: Article

References (11)

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