Investigation of reliability problems in thermal inkjet printhead

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2004, Pages 251-254

  Lim, Ji Hyuk ^a   Keon Kuk, ^a   Shin, Seung Joo ^a   Baek, Seog Soon ^a   Kim, Young Jae ^a   Shin, Jong Woo ^a   Oh, Yong Soo ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

Inkjet; MEMS

Indexed keywords

FINITE ELEMENT METHOD; HEAT RESISTANCE; MICROELECTROMECHANICAL DEVICES; SCANNING ELECTRON MICROSCOPY; THERMAL CYCLING; THERMAL STRESS; WEIBULL DISTRIBUTION;

FLOW INLET CHANNELS; MICRO HEATERS; THERMAL INKJET PRINTHEAD; VOLTAGE PULSES;

THERMAL PRINTING;

EID: 3042515091     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. S. S. Baek, H. T. Lim, H. Song, Y. S. Kim, K. D. Bae, C. H. Cho, C. S. Lee, J. W. Shin, K. Kuk, and Y. S. Oh, "T-jet : A novel thermal inkjet printhead with monolithically fabricated nozzle plate on SOI wafer," Transducers '03, 2003, pp. 472-475.
2. K. Kuk, J. H. Lim, M. S. Kim, M. C. Choi, C. H. Cho, and Y. S. Oh, "Research on micro heater efficiency for thermal inkjet head," IS&T's NIP19, 2003, pp. 298-302.
3. D. G. Pierce and P. G. Brusius, "Electromigration: A review," Microelectron. Reliab., 1997, pp. 1053-1072.
4. L. S. Chang and G. Olive, "Factors influencing the lifetime of thermal ink-jet heaters," SID 87 Digest, 1987, pp. 192-195.