MONO1001: A source for singly charged ions applied to the production of multicharged fullerene beams

Review of Scientific Instruments

Volumn 75, Issue 5 PART II, 2004, Pages 1884-1887

  Maunoury, L ^a   Andersen, J U ^b   Cederquist, H ^c   Huber, B A ^a   Hvelplund, P ^b   Leroy, R ^d   Manil, B ^a   Pacquet, J Y ^d   Pedersen, U V ^b   Rangamma, J ^b   Tomita, S ^b  

^a Centre Interdisciplinaire de Recherche Ions Lasers   (France)

^b AARHUS UNIVERSITY   (Denmark)

^c STOCKHOLM UNIVERSITY   (Sweden)

^d GANIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COLLISION AVOIDANCE; ELECTRON CYCLOTRON RESONANCE; ELECTROSTATICS; FULLERENES; ION BEAMS; ION SOURCES; MASS SPECTROMETRY; PARAMETER ESTIMATION;

CARBON CLUSTER IONS; MAGNETIC RINGS; MASS SEPARATION; MULTICHARGED FULLERENCE BEAMS;

CHARGED PARTICLES;

EID: 3042513499     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1699518     Document Type: Conference Paper

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