Low frequency noise characterization and modelling in ultrathin oxide MOSFETs

Solid-State Electronics

Volumn 50, Issue 1, 2006, Pages 63-68

  Contaret, T ^a   Romanjek, K ^a   Boutchacha, T ^b   Ghibaudo, G ^a   Boeuf F ^c  

^a IMEP LAHC   (France)

^b UNIVERSITÉ DES SCIENCES ET DE LA TECHNOLOGIE D ORAN MOHAMED BOUDIAF   (Algeria)

^c STMICROELECTRONICS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; LEAKAGE CURRENTS; OXIDES; SPURIOUS SIGNAL NOISE;

GATE-LEAKAGE CURRENT; NOISE MEASUREMENTS; ULTRATHIN OXIDE MOSFET;

MOSFET DEVICES;

EID: 30344438867     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2005.10.035     Document Type: Conference Paper

References (14)

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