Face recognition using face-ARG matching

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 27, Issue 12, 2005, Pages 1982-1988

  Park, Bo Gun ^a   Lee, Kyoung Mu ^b   Lee, Sang Uk ^b  

^a SAMSUNG Electronics   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

ARG matching; Face recognition; Stochastic analysis; Structural representation

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; FEATURE EXTRACTION; GRAPH THEORY; MATHEMATICAL MODELS; RANDOM PROCESSES;

ATTRIBUTED RELATIONAL GRAPH (ARG) MATCHING; STOCHASTIC ANALYSIS; STRUCTURAL REPRESENTATION;

FACE RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOLOGICAL MODEL; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; FACE; HISTOLOGY; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; INFORMATION RETRIEVAL; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICAL MODEL; THREE DIMENSIONAL IMAGING;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; FACE; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INFORMATION STORAGE AND RETRIEVAL; MODELS, BIOLOGICAL; MODELS, STATISTICAL; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SUBTRACTION TECHNIQUE;

EID: 30144437495     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2005.243     Document Type: Article

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