Face recognition using line edge map

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 24, Issue 6, 2002, Pages 767-779

  Gao, Yongsheng ^a,b   Leung, Maylor K H ^a,b  

^a IEEE   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Face recognition; Line edge map; Line segment Hausdorff distance; Structural information

Indexed keywords

EDGE DETECTION; EIGENVALUES AND EIGENFUNCTIONS; IMAGE CODING; LIGHTING;

LINE EDGE MAPS;

FACE RECOGNITION;

EID: 0036603178     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2002.1008383     Document Type: Article

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