Total ionizing dose and proton radiation characterization of Si P-i-N visible hybrid focal plane arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5902, Issue , 2005, Pages 1-15

  Hubbs, John E ^a   Gramer, Mark E ^a   Arrington, Douglas C ^a   Dole, Gary A ^a   Maestas Jepson, Diana ^a   Takeall, Sheldon E ^b  

^a BALL AEROSPACE AND TECHNOLOGIES CORP   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

CMOS; Proton Fluence; Si P i N Detectors; Total Ionizing Dose

Indexed keywords

PROTON FLUENCE; SI P-I-N DETECTORS; TOTAL IONIZING DOSE;

CMOS INTEGRATED CIRCUITS; DEGRADATION; IONIZATION; PROTONS; RADIATION EFFECTS; RADIOMETRY;

HYBRID SENSORS;

EID: 29844431633     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.625538     Document Type: Conference Paper

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