Compact soft x-ray source using Thomson scattering

Journal of Applied Physics

Volumn 98, Issue 12, 2005, Pages

  Kashiwagi, Shigeru ^a,d   Kuroda, Ryunosuke ^a,e   Oshima, Takashi ^a   Nagasawa, Fumio ^a   Kobuki, Tomoaki ^a   Ueyama, Daisuke ^a   Hama, Yoshimasa ^a   Washio, Masakazu ^a   Ushida, Kiminori ^b   Hayano, Hitoshi ^c   Urakawa, Junji ^c  

^a WASEDA UNIVERSITY   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^d OSAKA UNIVERSITY   (Japan)

^e NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT SOFT X-RAY; ELECTRON RF GUN; PICOSECOND LASER SYSTEM; THOMSON SCATTERING;

ELECTRON ABSORPTION; LASER BEAMS; MICROSCOPES; PHOTOCATHODES; PHOTONS; SCATTERING;

X RAY ANALYSIS;

EID: 29744468173     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2148619     Document Type: Review

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