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Volumn 52, Issue 18, 2005, Pages 2713-2721

Observation of Gouy-phase-induced transversal intensity changes in focused beams

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 29744467428     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340500347121     Document Type: Article
Times cited : (10)

References (22)
  • 2
    • 0003434416 scopus 로고
    • (Oxford University Press, Oxford), Note that Gouy's name is misspelled as 'Guoy' in this reference
    • A.E. Siegman, Lasers (Oxford University Press, Oxford, 1986). Note that Gouy's name is misspelled as 'Guoy' in this reference.
    • (1986) Lasers
    • Siegman, A.E.1
  • 10
    • 0003972070 scopus 로고    scopus 로고
    • (Cambridge University Press, Cambridge), chapter 8.8
    • M. Born and E. Wolf, Principles of Optics (Cambridge University Press, Cambridge, 1997) chapter 8.8.
    • (1997) Principles of Optics
    • Born, M.1    Wolf, E.2
  • 14
    • 29744462850 scopus 로고    scopus 로고
    • Optical Particle Manipulation Systems. UK Patent application No. 0327649.0
    • O. Steuernagel, Optical Particle Manipulation Systems. UK Patent application No. 0327649.0, (2003);
    • (2003)
    • Steuernagel, O.1
  • 19
    • 24144488285 scopus 로고    scopus 로고
    • eprint physics/0312116 (2003)
    • O. Steuernagel, Am. J. Phys. 73 625 (2005); eprint physics/0312116 (2003).
    • (2005) Am. J. Phys. , vol.73 , pp. 625
    • Steuernagel, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.