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Volumn 52, Issue 18, 2005, Pages 2713-2721
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Observation of Gouy-phase-induced transversal intensity changes in focused beams
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Author keywords
[No Author keywords available]
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Indexed keywords
OPTICAL PROPERTIES;
TRANSMISSION ELECTRON MICROSCOPY;
INTERFERENCE EFFECTS;
TRANSVERSE INTENSITY;
LIGHT;
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EID: 29744467428
PISSN: 09500340
EISSN: 13623044
Source Type: Journal
DOI: 10.1080/09500340500347121 Document Type: Article |
Times cited : (10)
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References (22)
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