Effect of isothermal heat treatment on plasma-sprayed yttria-stabilized zirconia studied by impedance spectroscopy

Journal of the American Ceramic Society

Volumn 88, Issue 2, 2005, Pages 324-330

  Anderson, Piers S ^a   Wang, Xin ^a   Xiao, Ping ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; HEAT TREATMENT; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS; ZIRCONIA;

ISOTHERMAL HEAT TREATMENT; MICROINDENTATION;

ISOTHERMS;

EID: 29744461097     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00088.x     Document Type: Article

References (21)

1. R. A. Miller, "Thermal Barrier Coatings for Aircraft Engines: History and Directions," J. Therm. Spray Technol., 6 [1] 35-42 (1997).
2. Z. Mutasim and W. Brentnall, "Thermal Barrier Coatings for Industrial Gas Turbine Applications: An Industrial Note," J. Therm. Spray Technol., 6 [1] 105-8 (1997).
3. S. M. Meier and D. K. Gupta, "The Evolution of Thermal Barrier Coatings in Gas-Turbine Engine Applications," J. Eng. Gas Turbines Power (Trans. ASME), 116, 250-7 (1994).
4. R. W. Trice, Y. J. Su, J. R. Mawdsley, K. T. Faber, A. R. De Arellano Lopez, H. Wang, and W. D. Porter, "Effect of Heat Treatment on Phase Stability, Microstructure, and Thermal Conductivity of Plasma-Sprayed YSZ," J. Mater. Sci., 37, 2359-65 (2002).
5. J. Ilavsky, G. G. Long, A. J. Allen, and C. C. Berndt, "Evolution of the Void Structure in Plasma-Sprayed YSZ Deposits During Heating," Mater. Sci. Eng., A272, 215-21 (1999).
6. J. Ilavsky and J. K. Stalick, "Phase Composition and its Changes During Annealing of Plasma-Sprayed YSZ," Surf. Coat. Technol., 127, 120-9 (2000).
7. 2 Coatings," Surf. Coat. Technol., 155, 1-10 (2002).
8. X. Wang, J. Mei, and P. Xiao, "Determining Oxide Growth in Thermal Barrier Coatings (TBCs) Non-Destructively Using Impedance Spectroscopy," J. Mater. Sci. Lett., 20, 47-9 (2001).
9. X. J. Chen, K. A. Khor, S. H. Chan, and L. G. Yu, "Influence of Microstructure on the Ionic Conductivity of Yttria-Stabilized Zirconia Electrolyte," Mater. Sci. Eng., A335, 246-52 (2002).
10. A. P. Santos, R. Z. Domingues, and M. Kleitz, "Grain Boundary Blocking Effect in Tetragonal Yttria Stabilized Zirconia," J. Eur. Ceram. Soc., 18, 1571-8 (1998).
11. M. C. Steil, F. Thevenot, and M. Kleitz, "Densification of Yttria-Stabilized Zirconia," J. Electrochem. Soc., 144 [1] 390-8 (1997).
12. I. R. Gibson, G. P. Dransfield, and J. T. S. Irvine. "Sinterability of Commercial 8 mol% Yttria-Stabilized Zirconia Powders and the Effect of Sintered Density on the Ionic Conductivity," J. Mater. Sci., 33, 4297-305 (1998).
13. S. P. S. Badwal, "Grain Boundary Resistivity in Zirconia-Based Materials: Effect of Sintering Temperatures and Impurities," Solid State Ionics, 76, 67-80 (1995).
14. M. Aoki, Y.-M. Chiang, I. Kosacki, L. J.-R. Lee, H. Tuller, and Y. Liu, "Solute Segregation and Grain-Boundary Impedance in High-Purity Stabilized Zirconia," J. Am. Ceram. Soc., 79 [5] 1169-80 (1996).
15. 2 Polycrystals (Y-TZP):" pp. 352-370 in Advances in Ceramics, Vol. 12, Science and Technology of Zirconia II, Edited by N. Claussen, M. Rühle, and A. H. Heuer. American Ceramic Society, Columbus, OH, 1984.
16. 3 Ceramic System," J. Mater. Sci. Lett., 8, 55-7 (1989).
17. 3)," Solid State Ionics, 109, 167-86 (1998).
18. C. Bowen, S. Ramesh, C. Gill, and S. Lawson, "Impedance Spectroscopy of CuO-Doped Y-TZP Ceramics," J. Mater. Sci., 33, 5103-10 (1998).
19. E. J. Abram, D. C. Sinclair, and A. R. West, "Electrode-Contact Spreading Resistance Phenomena in Doped-Lanthanum Gallate Ceramics," J. Electroceram., 7 [3] 179-88 (2001).
20. A. M. Rodriguez, M. C. Caracoche, P. C. Rivas, A. F. Pasquevich, and S. R. Mintzer, "PAC Characterization of Nontransformable Tetragonal t' Phase in Arc-Melted Zirconia-2.8 mol% Yttria Ceramics," J. Am. Ceram. Soc., 84 [1] 188-92 (2001).
21. J. T. S. Irvine, D. C. Sinclair, and A. R. West, "Electroceramics: Characterization by Impedance Spectroscopy," Adv. Mat., 2 [3] 132-8 (1990).