Determining oxide growth in thermal barrier coatings (TBCs) non-destructively using impedance spectroscopy

Journal of Materials Science Letters

Volumn 20, Issue 1, 2001, Pages 47-49

  Wang, Xin ^a   Mei, Junfa ^a   Xiao, Ping ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC IMPEDANCE MEASUREMENT; ENERGY DISPERSIVE SPECTROSCOPY; NONDESTRUCTIVE EXAMINATION; OXIDATION; SCANNING ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS; ZIRCONIA;

YTTRIA;

PROTECTIVE COATINGS;

EID: 0034824861     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006710714273     Document Type: Article

References (10)

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