Electron-beam tip/sample heating device for a scanning tunneling microscopy

Review of Scientific Instruments

Volumn 76, Issue 12, 2005, Pages 1-4

  Ding, H F ^a   Pearson, J E ^a   Li, Dongqi ^a   Cheng, Ruihua ^a   Fradin, F Y ^a   Bader, S D ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEATING DEVICE; SPIN-POLARIZED IMAGING; TRANSFER PATHS;

HEATING; IMAGING SYSTEMS; POLARIZATION; SCANNING TUNNELING MICROSCOPY; VACUUM APPLICATIONS;

ELECTRON BEAMS;

EID: 29744439235     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2140339     Document Type: Article

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