SCOPUS 정보 검색 플랫폼

Volumn 21, Issue 12, 2005, Pages 1379-1382

Precise determination of extended dislocation boundary plane in transmission electron microscopy

Author keywords

Boundary crystallographic plane; Boundary macroscopic plane; Boundary spacing; Grain orientation effect; Planar dislocation boundary; TEM

Indexed keywords

ALUMINUM COMPOUNDS; BOUNDARY CONDITIONS; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY;

BOUNDARY CRYSTALLOGRAPHIC PLANE; BOUNDARY MACROSCOPIC PLANE; BOUNDARY SPACING; GRAIN ORIENTATION EFFECT; PLANAR DISLOCATION BOUNDARY;

DISLOCATIONS (CRYSTALS);

EID: 29444455720 PISSN: 02670836 EISSN: None Source Type: Journal
DOI: 10.1179/174328405X71576 Document Type: Conference Paper

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.