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Volumn 51, Issue 5, 2004, Pages 411-415

Creep of nearly lamellar TiAl alloy containing W

Author keywords

phase; Creep behavior; Lamellar TiAl; Ultrafine lamellar microstructure

Indexed keywords

ADDITION REACTIONS; COMPOSITION; CREEP; EXTRUSION; INTERFACES (MATERIALS); MICROSTRUCTURE; STRESS ANALYSIS; TUNGSTEN;

EID: 2942752494     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2004.05.005     Document Type: Article
Times cited : (70)

References (29)
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    • 0030291718 scopus 로고    scopus 로고
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    • (1996) JOM , vol.48 , Issue.11 , pp. 46
    • Brady, M.P.1
  • 14
    • 0002233676 scopus 로고
    • Y.W. Kim, R. Wagner, & M. Yamaguchi. USA: Warrendale
    • Beddoes J., et al. Kim Y.W., Wagner R., Yamaguchi M. Gamma titanium aluminides. 1995;959 Warrendale, USA.
    • (1995) Gamma Titanium Aluminides , pp. 959
    • Beddoes, J.1
  • 26


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.