Functional and technological integration of measurement microsystems

IEEE Instrumentation and Measurement Magazine

Volumn 7, Issue 2, 2004, Pages 14-19

  Barwicz, Andrzej ^a  

^a UNIVERSITÉ DU QUÉBEC À TROIS RIVIÈRES   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); DIGITAL SIGNAL PROCESSING; MICROELECTRONICS; MICROOPTICS; MICROPROCESSOR CHIPS; SYSTEM THEORY;

MEASUREMENT MICROSYSTEMS; MEASUREMENT SIGNAL; MICRO-OPTO-ELECTRICAL SYSTEM; MICROSPECTROMETER;

MEASUREMENT THEORY;

EID: 2942724544     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2004.1304561     Document Type: Article

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