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Volumn 19, Issue 3-4, 1996, Pages 131-138

A system approach to electrical measurements

Author keywords

Electrical measurement; Integration; Micro systems; Signal processing; System approach

Indexed keywords

ALGORITHMS; COMPUTER APPLICATIONS; DESIGN; MICROELECTRONICS; MICROMACHINING; OPTICS; SENSORS; SIGNAL PROCESSING; VLSI CIRCUITS;

EID: 0030282530     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(97)00008-0     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.