Novel form birefringence modeling for an ultracompact sensor in porous silicon films using polarization interferometry

IEEE Photonics Technology Letters

Volumn 16, Issue 6, 2004, Pages 1546-1548

  O, Beom Hoan ^a   Choi, Chul Hyun ^a   Jo, Soo Beom ^a   Lee, Min Woo ^a   Park, Dong Gue ^b   Kang, Byeong Gwon ^b   Kim, Sun Hyung ^b   Liu, Rong ^c   Li, Yang Yang ^d   Sailor, Michael J ^d   Fainman, Yeshaiahu ^c  

^a Inha University   (South Korea)

^b Soonchunhyang University   (South Korea)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Birefringence; Boundary condition (BC) model; Effective medium approximation (EMA); Polarization interferometer; Porous silicon (PSi); Simulation

Indexed keywords

BIREFRINGENCE; LIGHT POLARIZATION; MATHEMATICAL MODELS; POROUS SILICON;

POLARIZATION INTERFEROMETRY; ULTRACOMPACT SENSOR;

INTERFEROMETRY;

EID: 2942711725     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2003.821096     Document Type: Article

References (7)

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