Asymmetrical dual-cavity filters and their application to thickness uniformity monitoring

Optics Express

Volumn 11, Issue 25, 2003, Pages 3393-3403

  Poitras, Daniel ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FABRICATION; FABRY-PEROT INTERFEROMETERS; MATHEMATICAL MODELS; PROTECTIVE COATINGS; REFRACTIVE INDEX; SPECTRUM ANALYSIS; TELECOMMUNICATION;

DEPOSITION AND FABRICATION; FABRY-PEROT; THICKNESS UNIFORMITIES;

OPTICAL FILTERS;

EID: 2942709620     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.11.003393     Document Type: Article

References (5)

1. J. A. Dobrowolski, S. Browning, M. Jacobson, and M. Nadal, "2001 Optical Society of America Topical Meeting on Optical Coatings: Manufacturing Problem," Appl. Opt. 41, 1-14 (2002).
2. S.D. Smith, "Design of Multilayer Filters by Considering Two Effective Interfaces," J. Opt. Soc. Am. 48, 43-50 (1958).
3. H. A. Macleod, Thin-film optical filters (Institute of Physics, Bristol, 2001).
4. D. Poitras, T. Cassidy, and S. Guétré, "Asymmetrical Dual-Cavity Filters: Theory and Application," in Optical Interference Coatings, OSA Technical Digest, pp. MD3-1-3 (Optical Society of America, Washington D.C., 2001).
5. D. I. Pearson, P. Luff, M. Davis, and A. T. Howe, "Use of asymmetric dual-cavity filters to track small H and L variations as a tool to increase yield of DWDM filters," in Photonic Integrated Systems, L. A. Eldada, A. R. Pirich, P. L. Repak, R. T. Chen and J. C. Chon, eds., Proc. SPIE 4998, 178-185 (2003).