Time efficient Chinese remainder theorem algorithm for full-field fringe phase analysis in multi-wavelength interferometry

Optics Express

Volumn 12, Issue 6, 2004, Pages 1136-1143

  Towers, Catherine E ^a   Towers, David P ^a   Jones, Julian D C ^a  

^a HERIOT WATT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; MATHEMATICAL MODELS; MATRIX ALGEBRA; PERFORMANCE; SENSORS; THEOREM PROVING;

CHINESE REMAINDER THEOREM (CRT); MULTI-WAVELENGTH INTERFEROMETRY;

INTERFEROMETRY;

EID: 2942704154     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.001136     Document Type: Article

References (17)

1. C. Fabry and A. Ferot, "Measures of absolute wavelengths in the solar spectrum and in the spectrum of iron," Astrophysical J. 15, 73 (1902).
2. F. H. Rolt, "The application of optics to engineering measurements," Engineering 144, 162 (1937).
3. M. Kujawinska, J. Wojciak, "High Accuracy Fourier Transform Fringe Pattern Analysis," Opt. Lasers Eng. 14, 325 (1991).
4. M. R. Benoit, "Applications des phenomenes d'interference a des determinations metrologiques," J. Phys. 3, 57 (1898).
5. M. Born, E. Wolf, Principles of Optics (Cambridge University Press, Seventh Edition, 2002).
6. C. R. Tilford, "Analytical procedure for determining lengths from fractional fringes," Appl. Opt. 16, 1857 (1977).
7. A. Pfoertner, J. Schwider, "Red-green-blue interferometer for the metrology of discontinuous structures," Appl. Opt. 42, 667 (2003).
8. Y. Cheng, J. Wyant, "Multiple-wavelength phase-shifting interferometry," Appl. Opt. 24, 804 (1985).
9. C. Creath, "Temporal Phase Measurement," in Interferogram Analysis editors D.W. Robinson G. T. Reid (Bristol, Institute of Physics Publishing 1993).
10. P.J. de Groot, "Extending the unambiguous range of two-color interferometers," Appl. Opt. 33, 5948 (1994).
11. C. E. Towers, D. P. Towers, J. D. C. Jones, "Optimum frequency selection in multi-frequency interferometry," Opt. Lett. 28, 887 (2003).
12. M. Reeves, A.J. Moore, D.P. Hand, J.D.C. Jones, "Dynamic shape measurement system for laser materials processing," Opt. Eng. 42, 2923 (2003).
13. K. H. Rosen, Elementary number theory and its applications (Addison-Wesley publishing Co., 1988).
14. I. Agurok, "The rigorous decision of the excess fraction method in absolute distance interferometry," SPIE 3134, 504 (1997).
15. M Takeda, Q. Gu, M. Kinoshita, H Takai, Y Takahash, "Frequency- multiplex Fourier-transform profilometry: a single-shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations," Appl. Opt. 36, 5347 (1997).
16. J. Zhong, Y. Zhang, "Absolute phase measurement technique based on number theory in multi-frequency grating projection profilometry," Appl. Opt. 40, 492 (2001).
17. J. M. Huntley, "Random phase measurement errors in digital speckle pattern interferometry," Opt. Lasers Eng. 26, 131 (1997).