|
Volumn 1, Issue , 2004, Pages 1-6
|
Hardware design and measurement results for an electrical capacitance tomography system
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALGORITHMS;
CAPACITANCE MEASUREMENT;
COMPUTER HARDWARE;
COMPUTER SIMULATION;
DIELECTRIC MATERIALS;
ELECTRODES;
NETWORKS (CIRCUITS);
PERMITTIVITY MEASUREMENT;
SENSORS;
VOLTAGE MEASUREMENT;
ELECTRIC CAPACITANCE TOMOGRAPHY;
INTERELECTRODE CAPACITANCE;
MULTIPLE ELECTRODE POTENTIAL;
PERMITTIVITY DISTRIBUTION;
PROTOTYPE SENSORS;
TOMOGRAPHY;
|
EID: 2942704061
PISSN: 10007105
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
|
References (5)
|