A study of amorphous Ti-Ni alloys by X-ray photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 135, Issue 2-3, 2004, Pages 135-141

  Seabolt, M A ^a   Ogden, W R ^a   Chourasia, A R ^a   Ishida, A ^b  

^a TEXAS A AND M UNIVERSITY COMMERCE   (United States)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Auger parameter; Nickel; Shape memory alloys; Titanium; X ray photoelectron spectroscopy

Indexed keywords

BINDING ENERGY; CRYSTALLINE MATERIALS; DUCTILITY; ELECTROSTATICS; IONIZATION; MAGNETRON SPUTTERING; NICKEL; SHAPE MEMORY EFFECT; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER PARAMETERS; ELECTRONEGATIVITY; ELECTROSTATIC MODEL;

TITANIUM ALLOYS;

EID: 2942683494     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.02.167     Document Type: Article

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