SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 784, Issue , 2003, Pages 363-368

Ferroelectric films and multilayers with ultrahigh dielectric constants

(5) Li, Kewen a Zou, Kevin a Wang, Yanyun a Jiang, Hua a Chen, Xuesheng b

a Boston Applied Technologies Inc (United States)

b WHEATON COLLEGE (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL DEVICES; ENERGY STORAGE; GRAIN BOUNDARIES; LATTICE CONSTANTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROELECTROMECHANICAL DEVICES; MULTILAYERS; PERMITTIVITY; SEMICONDUCTING LEAD COMPOUNDS; SUBSTRATES;

CRYSTALLINITY; CURIE TEMPERATURES; DIP COATING METHODS; TEMPERATURE RESPONSE;

FERROELECTRIC THIN FILMS;

EID: 2942677227 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-784-c8.9 Document Type: Conference Paper

Times cited : (1)

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