Diffraction of neutral helium clusters: Evidence for "Magic numbers"

Physical Review Letters

Volumn 92, Issue 18, 2004, Pages

  Brühl, Rüdiger ^a,e   Guardiola, Rafael ^b   Kalinin, Anton ^a   Kornilov, Oleg ^a   Navarro, Jesús ^c   Savas, Tim ^d   Toennies, J Peter ^a  

^a MAX PLANCK INSTITUTE FOR DYNAMICS AND SELF ORGANIZATION   (Germany)

^b UNIVERSITY OF VALENCIA   (Spain)

^c INSTITUTO DE FÍSICA CORPUSCULAR IFIC   (Spain)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYOGENICS; DIFFRACTION; ELECTRON ENERGY LEVELS; IONIZATION; MONTE CARLO METHODS; NONDESTRUCTIVE EXAMINATION; PARTICLE SIZE ANALYSIS; QUANTUM THEORY;

CLUSTER SIZE DISTRIBUTIONS; DIFFRACTION ANGLES; DIFFUSION MONTE CARLO (DMC) CALCULATIONS;

SUPERFLUID HELIUM;

EID: 2942677214     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.92.185301     Document Type: Article

References (22)

1. See the reviews in Clusters of Atoms and Molecules, edited by H. Haberland (Springer, Berlin, 1994)
2. W. A. de Heer, Rev. Mod. Phys. 65, 611 (1993)
3. P. Sindzingre, M.L. Klein, and D.M. Ceperley, Phys. Rev. Lett. 63, 1601 (1989)
4. S. Grebenev, J. P. Toennies, and A. F. Vilesov, Science 279, 2083 (1998).
5. See, for example, the reviews in Microscopic Approaches to Quantum Liquids in Confined Geometries, edited by E. Krotscheck and J. Navarro (World Scientific, Singapore, 2002).
6. T. Regge, J. Low Temp. Phys. 9, 123 (1972).
7. R. Melzer and J.G. Zabolitzky, J. Phys. A 17, L565 (1984).
8. W. Schöllkopf and J.P. Toennies, Science 266, 1345 (1994).
9. L. Bruch, W. Schöllkopf, and J. P. Toennies, J. Chem. Phys. 117, 1544 (2002).
10. R. E. Grisenti, W. Schöllkopf, J. P. Toennies, G. C. Hegerfeldt, and T. Köhler, Phys. Rev. Lett. 83, 1755 (1999).
11. The ultimate resolution was achieved by tilting the grating with respect to the beam axis. This way the grating period is effectively reduced, which leads to an effective increase in resolution.
12. R. E. Grisenti, W. Schöllkopf, J. P. Toennies, J. R. Manson, T. A. Savas, and H. I. Smith, Phys. Rev. A 61, 033608 (2000).
13. The data at positive angles are omitted since diffraction patterns are invariably symmetric with respect to the specular peak
14. W. Schöllkopf and J. P. Toennies, J. Chem. Phys. 104, 1155 (1996).
15. B. E. Callicoatt et al., J. Chem. Phys. 109, 10195 (1998).
16. F. Bottiglioni, J. Contant, and M. Fois, Phys. Rev. A 6, 1830 (1972).
17. M. Villarica, M. J. Casey, J. Goodisman, and J. Chaiken, J. Chem. Phys. 98, 4610 (1993).
18. M. Lewerenz, B. Schilling, and J. P. Toennies, Chem. Phys. Lett. 206, 381 (1993).
19. J. Chaiken and J. Goodisman, J. Cluster Sci. 6, 319 (1995).
20. R. Guardiola, J. Navarro, and M. Portesi, Phys. Rev. B 63, 224519 (2001).
21. E. Krotscheck and S. Chin, Phys. Rev. B 52, 10405 (1995).
22. D. Blume and C. H. Greene, J. Chem. Phys. 112, 8053 (2000).