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Microchimica Acta

Volumn 145, Issue 1-4, 2004, Pages 19-23

X-ray analysis of multi-films for electrochromic device application

(4) Cui, Hai Ning a Jia, Shu b Meng, Li Jian c Teixeira, Vasco c

a UNIVERSITY OF MINHO (Portugal)

b TSINGHUA UNIVERSITY (China)

c INSTITUTO SUPERIOR DE ENGENHARIA DO PORTO (Portugal)

Author keywords

Grazing incidence XRD (GIXD); Thin films; X ray analysis; XPS (X ray photoelectron spectroscopy); XRD (x ray diffraction)

Indexed keywords

CADMIUM SULFIDE; INDIUM; OXIDE; TIN; TUNGSTEN;

CONFERENCE PAPER; FILM; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 2942673114 PISSN: 00263672 EISSN: None Source Type: Journal
DOI: 10.1007/s00604-003-0121-2 Document Type: Conference Paper

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.