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Volumn 145, Issue 1-4, 2004, Pages 229-235
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A check total for validating standardless and normalised EDX analysis at low kV
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Author keywords
EDX; Low kV; Microanalysis; X ray
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Indexed keywords
ACCURACY;
ANALYTICAL ERROR;
CALCULATION;
CALIBRATION;
CHEMICAL COMPOSITION;
CONFERENCE PAPER;
ENERGY DISPERSIVE X RAY ANALYSIS;
MICROSCOPE;
PREDICTION;
RADIATION BEAM;
SIMULATION;
STANDARD;
VALIDATION PROCESS;
X RAY ANALYSIS;
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EID: 2942673094
PISSN: 00263672
EISSN: None
Source Type: Journal
DOI: 10.1007/s00604-003-0159-1 Document Type: Conference Paper |
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Times cited : (7)
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References (3)
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