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Journal of the Electrochemical Society

Volumn 151, Issue 6, 2004, Pages

Investigation of nanoporous thin-film alumina templates

(1) Das, Biswajit a

a UNIVERSITY OF NEVADA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRON MICROSCOPY; GLASS; INDIUM COMPOUNDS; NANOSTRUCTURED MATERIALS; POROUS MATERIALS; SILICON CARBIDE; THIN FILMS; VOLTAGE MEASUREMENT;

INDIUM TIN OXIDE (ITO) COATED GLASS; NANOPOROUS THIN-FILM ALUMINA TEMPLATES; PORE FORMATION; SEMICONDUCTOR SUBSTRATES;

ALUMINA;

EID: 2942666217 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.1738136 Document Type: Article

Times cited : (17)

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