Electronic structure of cubic and rhombohedral tantalum carbonitrides studied by XPS, XES, and XAS methods

Journal of Electron Spectroscopy and Related Phenomena

Volumn 137-140, Issue SPEC. ISS., 2004, Pages 463-467

  Khyzhun, O Yu ^a   Kolyagin, V A ^b  

^a INSTITUTE OF HYDROBIOLOGY   (Ukraine)

^b RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

Electronic structure; Tantalum carbides; Tantalum carbonitrides; XAS; XES; XPS

Indexed keywords

ABSORPTION SPECTROSCOPY; BINDING ENERGY; CHEMICAL BONDS; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; LATTICE CONSTANTS; STOICHIOMETRY; TANTALUM CARBIDE; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

TANTALUM CARBIDES; TANTALUM CARBONITRIDES; X-RAY ABSORPTION SPECTROSCOPY (XAS); X-RAY EMISSION SPECTROSCOPY (XES); XAS; XES;

NITRIDES;

EID: 2942624439     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.02.073     Document Type: Conference Paper

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