Electronic structure of tantalum subcarbides studied by XPS, XES, and XAS methods

Journal of Electron Spectroscopy and Related Phenomena

Volumn 82, Issue 3, 1996, Pages 179-192

  Khyzhun, O Yu ^a   Zhurakovsky, E A ^a   Sinelnichenko, A K ^a   Kolyagin, V A ^b  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^b RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

Electronic structure; Substoichiometric compounds; XPS spectra

Indexed keywords

EID: 0001398275     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(96)03057-5     Document Type: Article

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