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Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 793-796

Novel micro interferometer for length measurements

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; LASER BEAMS; LIGHT INTERFERENCE; LIGHT PROPAGATION; OPTICAL VARIABLES MEASUREMENT; PHOTODETECTORS; PHOTODIODES; SILICON ALLOYS;

EID: 2942622228     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2004.03.093     Document Type: Conference Paper
Times cited : (8)

References (8)
  • 1
    • 26544475936 scopus 로고    scopus 로고
    • Deutsches Patent DE 330069, 1983
    • H. Büchner, Deutsches Patent DE 330069, 1983.
    • Büchner, H.1
  • 8
    • 2942530178 scopus 로고    scopus 로고
    • PhD thesis, University of Ilmenau, Germany, (ISBN: 3-932633-05-9)
    • U. Gerhardt, PhD thesis, University of Ilmenau, Germany, 2002 (ISBN: 3-932633-05-9).
    • (2002)
    • Gerhardt, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.