ToF-SIMS characterization of hybridization onto self-assembled single-stranded DNA monolayers

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 397-401

  Samuel, N T ^a   Castner, D G ^b  

^a University of Washington   (United States)

^b University of Washington   (United States)

Author keywords

DNA; Hybridization; PCA; Self assembled monolayers; ToF SIMS

Indexed keywords

MONOLAYERS; PRINCIPAL COMPONENT ANALYSIS; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY; SPECTRUM ANALYSIS; SUGARS; SURFACE PLASMON RESONANCE;

DNA PROBES; HYBRIDIZATION; MICROARRAYS; TOF SIMS;

DNA;

EID: 2942616755     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.146     Document Type: Conference Paper

References (3)

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2. Herne T.M., Tarlov M.J. J. Am. Chem. Soc. 119:1997;8916.
3. Wagner M.S., Castner D.G. Langmuir. 17:2001;4649.