Advantages of polarized two-beam second-harmonic generation in precise characterization of thin films

Journal of Chemical Physics

Volumn 120, Issue 19, 2004, Pages 9245-9252

  Cattaneo, Stefano ^a   Vuorimaa, Elina ^a   Lemmetyinen, Helge ^a   Kauranen, Martti ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; FLUORESCENCE; FREQUENCIES; GLASS; INTERFACES (MATERIALS); LANGMUIR BLODGETT FILMS; LASER BEAMS; LIGHT POLARIZATION; LIGHT SCATTERING; MONOLAYERS; NONLINEAR OPTICS; TENSORS; THIN FILMS;

NONCOLLINEAR GEOMETRY; POLARIZATION STATES; SUM-FREQUENCY GENERATION (SFG); SURFACE SENSITIVITY;

SECOND HARMONIC GENERATION;

EID: 2942597840     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1710858     Document Type: Article

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