High mass resolution SIMS

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 972-975

  Maharrey, S ^a   Bastasz, R ^a   Behrens, R ^a   Highley, A ^a   Hoffer, S ^a   Kruppa, G ^a   Whaley, J ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Chemical imaging; FTICR; LMIS; PCA; Reflectron; ToF

Indexed keywords

ALUMINUM; CYCLOTRONS; EPOXY RESINS; INTERFACES (MATERIALS); KINETIC ENERGY; MOLECULAR BIOLOGY; OPTICAL RESOLVING POWER; PARTICLE SIZE ANALYSIS; SECONDARY ION MASS SPECTROMETRY;

CHEMICAL IMAGING; FTICR; LMIS; TIME OF FLIGHT (TOF);

SURFACE PHENOMENA;

EID: 2942590445     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.197     Document Type: Conference Paper

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4. Kovtoun S.V., English R.D., Cotter R.J. J. Am. Soc. Mass Spectrom. 13:2002;135.