QSA influences on isotopic ratio measurements

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 874-877

  Slodzian, G ^a   Hillion, F ^b   Stadermann, F J ^c   Zinner, E ^c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b CAMECA   (United States)

^c WASHINGTON UNIVERSITY   (United States)

Author keywords

Electron multiplier; Isotopes; Silicon; SIMS; Sulfur

Indexed keywords

APPROXIMATION THEORY; COMPUTATION THEORY; ELECTRON MULTIPLIERS; SECONDARY ION MASS SPECTROMETRY; SILICON; STATISTICAL METHODS; SULFUR;

QUANTUM DETECTION EFFICIENCY; QUASI SIMULTANEOUS ARRIVALS (QSA); REAL NUMBERS; SECONDARY IONS;

ISOTOPES;

EID: 2942588687     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.155     Document Type: Conference Paper

References (3)

1. G. Slodzian, B. Daigne, F. Girard, F. Hillion, A high resolution scanning ion microscope with parallel detection of secondary ions, in: Proceedings of the Eighth SIMS Conference, Amsterdam, 1991.
2. F. Hillion, B. Daigne, F. Girard, G. Slodzian, A new high performance instrument: the Cameca Nanosims 50, in: Proceedings of the Ninth SIMS Conference, Yokohama, November 1993.
3. Slodzian G., Chaintreau M., Dennebouy R., Rousse G. Precise in situ measurements of isotopic abundances with pulse counting of sputtered ions. EPJ Appl. Phys. 14(3):2001;199.