TOF-SIMS characterization of lubricants used in magnetic recording media

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 336-341

  Zhang, Bin C ^a   Liu, Hui Kathy ^a   Chang, Susan ^a  

^a SEAGATE TECHNOLOGY   (United States)

Author keywords

AM3001; Lubricant; Molecular weight; TOF SIMS; X 1P; Z DOL; Z TETRAOL

Indexed keywords

AROMATIC COMPOUNDS; ETHERS; MAGNETIC RECORDING; MOLECULAR WEIGHT; NUCLEAR MAGNETIC RESONANCE; SECONDARY ION MASS SPECTROMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

AM3001; TOF-SIMS; X-1P; Z-DOL; Z-TETRAOL;

LUBRICANTS;

EID: 2942588604     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.085     Document Type: Conference Paper

References (9)

1. Khurshudov A., Baumgart P., Waltman R.J. Wear. 225-229:1999;690-699.
2. Talke F.E. Wear. 190:1995;232-238.
3. V.J. Novotny, M.A. Baldwinson, J. Appl. Phys. 70 (10) (1991) 5647-5652.
4. Khurshudov A., Waltman R. Wear. 251:2001;1124-1132.
5. L.J. Huang, Y. Hung, S. Chang, in: G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds.), Secondary Ion Mass Spectrometry SIMS XI, Wiley, Chichester, 1998, pp. 563-566.
6. V.J. Novotny, X. Pan, C.S. Bhatia, J. Vac. Sci. Technol. 12 (5) (1994) 2879-2886.
7. Abe Y., Shibayama M., Matsuo T. Surf. Interf. Anal. 30(1):2000;632-634.
8. J.C. Vickerman, A. Swift, in: J.C. Visckerman (Ed.), Surface Analysis - The Principle Techniques, Wiley, Chichester, 2000 (Chapter 5).
9. Karris T.E. J. Coll. Interf. Sci. 225:2000;196-203.