Detection of the diatomic dications SiH 2+ and AlH 2+

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 82-85

  Franzreb, Klaus ^a   Sobers Jr , Richard C ^a   Lörincík, Jan ^a   Williams, Peter ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

AlH 2+; Auger decay; Core excitation; Diatomic dication; SiH 2+

Indexed keywords

AMORPHOUS SILICON; ARGON; CHEMICAL BONDS; CONTAMINATION; MOLECULAR STRUCTURE; SPECTRUM ANALYSIS; SPUTTERING; TOLUENE;

AUGER DECAY; CORE EXCITATION; DIATOMIC DICATION;

SILICON COMPOUNDS;

EID: 2942587011     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.040     Document Type: Conference Paper

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