Growth and ferroelectric study of Bi3.25La0.75Ti 3O12 thin films on different substrates

Journal of Crystal Growth

Volumn 267, Issue 1-2, 2004, Pages 110-116

  Zhai, Jiwei ^a,b   Shen, Bo ^a   Yao, Xi ^a   Haydn, Chen ^b  

^a TONGJI UNIVERSITY   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

A1. Characterization; A3. Polycrystalline deposition; B1. Inorganic compounds; B2. Ferroelectric materials

Indexed keywords

BISMUTH COMPOUNDS; CAPACITANCE; CHARACTERIZATION; DEPOSITION; LANTHANUM COMPOUNDS; OXYGEN; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS; TITANIUM; X RAY DIFFRACTION ANALYSIS;

CYCLING FREQUENCIES; POLYCRYSTALLINE DEPOSITION; SCANNING ELECTRON MICROGRAPHS;

FERROELECTRIC THIN FILMS;

EID: 2942576480     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.03.012     Document Type: Article

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