Imaging TOF-SIMS for the surface analysis of silver halide microcrystals

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 614-619

  Lenaerts, J ^a   Gijbels, R ^a   Van Vaeck, L ^a   Verlinden, G ^a   Geuens, I ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

Imaging; Microcrystals; Organic molecules; Polyatomic primary ions; TOF SIMS

Indexed keywords

CRYSTALS; IMAGING TECHNIQUES; IONS; MOLECULES; SECONDARY ION MASS SPECTROMETRY; SILVER COMPOUNDS;

PHOTOGRAPHIC MATERIALS;

SURFACE CHEMISTRY;

EID: 2942553396     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00777-8     Document Type: Conference Paper

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