Water-induced degradation in 0.91Pb(Zn1/3Nb2/3)O 3-0.09PbTiO3 single crystals

Journal of Applied Physics

Volumn 95, Issue 10, 2004, Pages 5920-5921

  Chen, W P ^a   Qi, J Q ^a   Wang, Y ^a   Jiang, X P ^a   Chan, H L W ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DIELECTRIC MATERIALS; ELECTROCHEMISTRY; ELECTRODES; LEAKAGE CURRENTS; NIOBIUM; SILVER; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DIELECTRIC MAXIMA; HYDROGEN CHARGING PROCESS; RELAXOR OXIDES;

LEAD COMPOUNDS;

EID: 2942552571     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1702095     Document Type: Article

References (5)

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3. J. L. Cao, L. T. Li, Y. L. Wang, J. Q. Zhao, and Z. L. Gui, Mater. Res. Bull. 36, 2103 (2001).
4. W. P. Chen, Y. Wang, Z. Peng, and H. L. W. Chan, Jpn. J. Appl. Phys. 42, L48 (2003).
5. J. D. Baniecki, J. S. Cross, M. Tsukada, and J. Watanabe, Appl. Phys. Lett. 81, 3837 (2002).