Study of Au-Si(1 0 0) interface by means of Si 2p core-level photoemission spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 137-140, Issue SPEC. ISS., 2004, Pages 97-100

  Haruyama, Yuichi ^a   Kanda, Kazuhiro ^a   Matsui, Shinji ^a  

^a UNIVERSITY OF HYOGO   (Japan)

Author keywords

Au Si interface; Electronic structure; Photoemission spectroscopy; Si(1 0 0); Synchrotron radiation

Indexed keywords

AMORPHOUS SILICON; AUGER ELECTRON SPECTROSCOPY; BINDING ENERGY; ELECTRONIC STRUCTURE; GOLD; LOW ENERGY ELECTRON DIFFRACTION; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SPECTRUM ANALYSIS;

AU-SI INTERFACE; ENERGY RESOLUTION; SYNCHROTON RADIATION; THREE PEAK STRUCTURE;

INTERFACES (MATERIALS);

EID: 2942538876     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.02.031     Document Type: Conference Paper

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