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Volumn 137-140, Issue SPEC. ISS., 2004, Pages 205-210
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High-resolution photoemission studies of adsorbates and overlayers on semiconductor surfaces
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Author keywords
Adsorbates; Photoelectron spectroscopy; Reconstructions; Si(1 1 1); Surface shifts
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Indexed keywords
ADSORBENTS;
ANNEALING;
ELECTRONIC STRUCTURE;
MOLECULAR STRUCTURE;
PHOTONS;
SEMICONDUCTOR MATERIALS;
SILICON;
SURFACE PROPERTIES;
SYNCHROTRON RADIATION;
PHOTON ENERGY;
RECONSTRUCTION;
SI(1 1 1);
SURFACE SHIFTS;
PHOTOELECTRON SPECTROSCOPY;
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EID: 2942534937
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2004.02.044 Document Type: Conference Paper |
Times cited : (2)
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References (17)
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