ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 850-853

  Engkvist, J ^a   Bexell, U ^a   Grehk, T M ^a   Olsson, M ^a  

^a DALARNA UNIVERSITY   (Sweden)

Author keywords

Alumina scale; FeCrAl; Oxidation; ToF SIMS

Indexed keywords

ALUMINA; COMPOSITION; DOPING (ADDITIVES); HIGH TEMPERATURE EFFECTS; OXIDATION; SECONDARY ION MASS SPECTROMETRY; SUBSTRATES; THERMAL CYCLING;

ALUMINA SCALES; DEPTH PROFILING; REACTIVE ELEMENTS (RE);

IRON ALLOYS;

EID: 2942528879     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.141     Document Type: Conference Paper

References (8)

1. Stott F.H., Wood G.C., Stringer J. Oxid. Met. 44:1995;113-145.
2. H. Hattendorf, A. Kolb-Telieps, et al., in: Proceedings of the EFC Workshop, 2001, pp. 135-147.
3. Badini C., Laurella F. Surf. Coat. Technol. 135:2001;291-298.
4. Graham M.J., Hussey R.J. Corros. Sci. 44:2002;319-330.
5. Tolpygo V.K., Viefhaus H. Oxid. Met. 52:1999;1-29.
6. Pint B.A., Martin J.R., Hobbs L.W. Solid State Ionics. 78:1995;99-107.
7. D. Naumenko, W.J. Quadakkers, et al., in: Proceedings of the EFC Workshop, 2001, pp. 66-82.
8. Mennicke C., et al. Oxid. Met. 49:1998;445-466.