DC electric and photoelectric measurements of CdTe thin films in Schottky-barrier cells

Physica B: Condensed Matter

Volumn 349, Issue 1-4, 2004, Pages 296-303

  Darwish, S ^a  

^a Minia University ^*  (Egypt)

Author keywords

CdTe thin films; Electric properties; Photoelectric measurements; Schottky barrier

Indexed keywords

CAPACITANCE; CURRENT DENSITY; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; ENERGY GAP; PHOTOELECTRICITY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR JUNCTIONS; X RAY DIFFRACTION ANALYSIS;

CDTE THIN FILMS; OPEN-CIRCUIT VOLTAGE; PHOTOELECTRIC MEASUREMENTS; TEMPERATURE DEPENDENCE;

THIN FILMS;

EID: 2942515030     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.03.249     Document Type: Article

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