Plasma interferometry and how the bound-electron contribution can bend fringes in unexpected ways

Applied Optics

Volumn 44, Issue 34, 2005, Pages 7295-7301

  Nilsen, Joseph ^a   Johnson, Walter R ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CARRIER CONCENTRATION; LIGHT REFRACTION; PHOTONS; PLASMAS; REFRACTIVE INDEX; X RAY ANALYSIS;

BOUND-ELECTRON CONTRIBUTION; FRINGES; PHOTON ENERGIES; X-RAY LASER;

INTERFEROMETRY;

EID: 29344464608     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.007295     Document Type: Article

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