Diagnostics of laser-induced plasma with soft X-ray (13.9 nm) bi-mirror interference microscopy

Applied Physics B: Lasers and Optics

Volumn 78, Issue 7-8, 2004, Pages 975-977

  Tang, H ^a   Guilbaud, O ^a   Jamelot, G ^a,d   Ros, D ^a   Klisnick, A ^a   Joyeux, D ^b   Phalippou, D ^b   Kado, M ^c   Nishikino, M ^c   Kishimoto, M ^c   Sukegawa, K ^c   Ishino, M ^c   Nagashima, K ^c   Daido, H ^c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b UNIV PARIS SUD   (France)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

^d UNIVERSITÉ LAVAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; INTERFEROMETERS; MIRRORS; NANOSTRUCTURED MATERIALS; REFLECTION; REFRACTIVE INDEX; ULTRAVIOLET RADIATION; X RAY LASERS;

BI-MIRROR INTERFERENCE MICROSCOPY; FILAMENTATION; PLASMA DIAGNOSIS;

LASER PRODUCED PLASMAS;

EID: 2642545825     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-004-1439-0     Document Type: Conference Paper

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