Specimen-induced aberrations and adaptive optics for microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5894, Issue , 2005, Pages 1-9

  Booth, Martin J ^a   Schwertner, Michael ^a   Wilson, Tony ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberrations; Adaptive optics; Confocal microscopy; Microscopy; Wave front sensing; Zernike polynomials

Indexed keywords

ABERRATIONS; FLUORESCENCE; IMAGE PROCESSING; INTERFEROMETERS; SCANNING;

CONFOCAL MICROSCOPY; WAVE FRONT SENSING; ZERNLIKE POLYNOMIALS;

ADAPTIVE OPTICS;

EID: 29344455147     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.616987     Document Type: Conference Paper

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