Mathematical study of metal nanoparticle size determination by single x-ray line profile analysis

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 6, 2005, Pages 3093-3100

  Aldea, N ^a   Barz, B ^a,b   Silipas, T D ^a   Aldea, F ^c   Wu, Z ^d  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

^b UNIVERSITY OF MISSOURI   (United States)

^c UNIVERSITY OF AGRICULTURAL SCIENCES AND VETERINARY MEDICINE   (Romania)

^d NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

Author keywords

Deconvolution; Fourier transform; Metal crystallite size; Microstrain; X ray diffraction

Indexed keywords

CATALYSTS; CRYSTALLITE SIZE; DECONVOLUTION; DISTRIBUTION FUNCTIONS; FOURIER TRANSFORMS; NICKEL; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

DECONVOLUTION TECHNIQUES; GENERALIZED DISTRIBUTION; METAL CRYSTALLITES; MICRO-STRAIN; MICROSTRUCTURAL PARAMETERS; SUPPORTED NICKEL CATALYSTS; SYNCHROTRON RADIATION FACILITY; X-RAY LINE PROFILE ANALYSIS;

METAL NANOPARTICLES;

EID: 29344444249     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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