A new X-ray line profile approximation used for the evaluation of the global nanostructure of nickel clusters

Journal of Optoelectronics and Advanced Materials

Volumn 6, Issue 1, 2004, Pages 225-235

  Aldea, N ^a   Tiusan, C V ^a   Barz, B ^a  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

Author keywords

Fourier transform; Supported metal catalysts, Crystallite size; X Ray diffraction

Indexed keywords

APPROXIMATION THEORY; CRYSTAL STRUCTURE; FERMI LEVEL; FOURIER TRANSFORMS; NANOSTRUCTURED MATERIALS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLITE SIZE; SUPPORTED METAL CATALYSTS;

CATALYSTS;

EID: 1842783113     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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