A novel method for measuring distribution of orientation of one-dimensional ZnO using resonance Raman spectroscopy

Journal of Raman Spectroscopy

Volumn 36, Issue 12, 2005, Pages 1101-1105

  Zhang, Xinghua ^a   Liu, Yichun ^a,b   Chen, Shihao ^a  

^a NORTHEAST NORMAL UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Low dimensional structure; Resonance Raman spectroscopy; ZnO

Indexed keywords

II-VI SEMICONDUCTORS; PHONONS; RAMAN SPECTROSCOPY; SPECTROSCOPIC ANALYSIS;

ANGULAR DISPERSIONS; GROWTH ORIENTATIONS; LOW DIMENSIONAL; LOW DIMENSIONAL STRUCTURE; NOVEL METHODS; ONE-DIMENSIONAL; PHONON MODE; RESONANCE RAMAN SPECTROSCOPY; SPECTROSCOPIC METHOD; ZNO STRUCTURES;

ZINC OXIDE;

EID: 29244485944     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/jrs.1413     Document Type: Article

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