Interferometric techniques for the characterization of temporal modulators

IEEE Photonics Technology Letters

Volumn 17, Issue 12, 2005, Pages 2688-2690

  Dorrer, Christophe ^a,b  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Chip parameter; Heterodyne detection; Homodyne detection; Interferometry; Optical hybrid; Response function; Temporal modulators

Indexed keywords

ELECTRIC FIELD EFFECTS; FOURIER TRANSFORMS; HETERODYNING; INTERFEROMETERS; INTERFEROMETRY; LASERS; LIGHT TRANSMISSION; MATHEMATICAL MODELS; MONOCHROMATORS; PHOTODETECTORS;

HETERODYNE MEASUREMENT; MONOCHROMATIC LASERS; TEMPORAL MODULATORS;

LIGHT MODULATORS;

EID: 29244481146     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2005.859366     Document Type: Article

References (10)

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